Description
WYLIE BT-22 — Precision Multimeter Test Leads for Board Repair
The WYLIE BT-22 is a universal multimeter test lead set designed for electronic testing, PCB diagnostics and precision repair applications.
Its main feature is the replaceable fine probe tip design, allowing technicians to replace the measuring tip without replacing the complete test lead set. Available product information indicates that the set includes six replacement steel probe tips in three different designs.
Replaceable Fine Probe Tips
The fine probe design makes the BT-22 suitable for applications requiring precise contact with small testing points and electronic components.
It can be useful when working on:
- Mobile phone motherboards
- Dense PCBs
- Small electronic components
- IC pins and test points
- Precision electronics diagnostics
- Micro-soldering work
The replaceable-tip construction also makes it easier to maintain the test leads over extended use.
Flexible Silicone Test Leads
The BT-22 uses flexible silicone-insulated wires designed for repeated use in electronics repair environments. Product listings describe the cable as flexible and resistant to heat, cold and repeated handling.
Available specifications also identify the conductor as tinned copper wire.
Designed for PCB Testing
The fine probe design provides better access to small and closely spaced test points compared with conventional larger probe tips.
This makes the BT-22 suitable for:
- Voltage measurements
- Electronic circuit testing
- PCB diagnostics
- Component testing
- Fault tracing
- Mobile phone motherboard repair
1000V / 20A Rating
The WYLIE BT-22 is listed with a maximum rating of 1000V / 20A.
Wide Meter Compatibility
The test leads use a universal-style multimeter connection and are listed as compatible with various types of measuring instruments, including digital multimeters, analog meters, clamp meters and bench meters.
For phone repair technicians, the BT-22 is particularly useful when precise contact with small motherboard test points is required.
